Scanning photocurrent microscopy (SPCM) is a powerful mapping equipment used to investigate spatially resolved optoelectronic properties of semiconductors. Laser excitation by raster scanning generates a position dependent photocurrent map from which carrier diffusion length, electric field distribution, doping concentration and more can be explored.
Nanobase's Xper-PC’s 3-probe measurement using a high performance 2-channel sourcemeter unit provides a variety of photocurrent information, helping you obtain such information more easily by displaying detailed photocurrent differences in a large area in a form of high quality 2D maps. The size of probe station is fully customizable, and we are more than happy to assist you with your even most unique needs so you can fulfill your research goals. Not only semiconductor analysis, XperPC offers a wide range of applications as well serving both research and industrial fields.
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Features
- Photocurrent imaging and analysis
- Ultra fast 2D scanning
- Bright field microscopic imaging
- Multiple laser selections available
- Measurement capabilities for source/drain, gate dependence
Components
- Microscope with objectives
- Laser scanning module
- Laser
- Photocurrent module
- Sourcemeter unit
- Software
Applications
- Quality analysis for 1D, 2D nanomaterials
- Analysis of electrical characteristics of semiconductor
- Analysis of electrical properties of materials (solar cell, battery)