When precision pushes boundaries, the Fischer FISCHERSCOPE XDAL redefines what’s possible. The innovative successor to the FISCHERSCOPE® X-RAY XDAL®, it is ideal for applications in the field of thin and very thin coatings < 0.05 μm and for material analysis in the ppm range. You can choose between models XDAL® 650, equipped with a powerful silicon drift detector 50 mm², and XDAL® 620, equipped with a silicon drift detector 20 mm². Together with our cutting-edge FISIQ X XRF software, this high-end solution ensures a smooth measuring process for greater convenience, safety, and maximum throughput.
At-a-glance:
- Unparalleled high precision with optimized measurement geometry
- High-speed Z-axis for super-fast sample positioning
- Enhanced usability and user guidance with FISIQ® X software
Optimum sample illumination and picture capture thanks to high resolution overhead camera and multizone LED lighting.
Measure your way - automated or manual - supported by a motorized hood for maximum flexibility
An improved distance between X-ray tube, sample and detector ensures maximum intensity and guarantees unparalleled measurement accuracy for maximum reliable and high-quality results.
Improve your productivity with simplified and efficient workflows, Meet FISIQ-X now: the first XRF software with AI technology
Features:
- Super-fast sample positioning: High-speed Z-axis 6 x faster*
- Rapid sample capture: Autofocus in under 2 seconds – 14 x faster*
- Automated operation: Automated or manual hood for maximum flexibility
- Optimum sample illumination and picture capture: 10 x higher* camera resolution and multizone LED lighting
- * In comparison to FISCHERSCOPE® X-RAY XDAL® 237.
- Unparalleled high precision and repeatable results: Optimized measurement geometry
- Device status always visible: Intuitive 180° status light
- Enhanced usability and user guidance: New FISIQ X software
- Large parts: C-slot allows large part measurement
More:
- Microfocus tube with tungsten anode, other anodes available on request
- C-slot housing for measuring larger samples
- Silicon drift detector 20 mm² or 50 mm² for highest precision on thin layers
- 4-fold changeable apertures and 6-fold changeable filters
- Individual approval as fully protected instrument
- FISIQ® X software with AI-supported spectrum mode for smarter measurement processes
- Stepless measuring distance with measuring top down
- Up to 140 mm possible heights of samples
- Automated hood and programmable measuring table for automated measurements
Application Examples:
- Analysis of very thin coatings of ≤ 0.1 μm (0.004 mils)
- Measurements of functional coatings in the electronics and semiconductor industries, e.g. on lead frames, connectors, or printed circuit boards
- Measurement of complex multilayer systems
- Automated measurements, e.g., in quality control
- Determination of the lead content in solder
- Determination of the phosphorous content in NiP coatings
- Determination of PCB finishes
Further information including Applications Notes, Tutorials and Webinars available here.
Download XRF Family product overview brochure here.
Download Fischer products overview brochure here.
For further information, please contact