TOPTICA’s TeraFlash smart utilizes a proprietary scheme dubbed ECOPS ("electronically controlled optical sampling"). The system comprises two synchronized femtosecond lasers, eliminating the need for a mechanical delay. This results in extremely high measurement speeds: the TeraFlash smart acquires 1600 complete terahertz waveforms per second, enabling terahertz-based thickness gauging at unprecedented speed. The system thus lends itself to measurements on rapidly moving samples, e.g. conveyor belts, papermaking machines, or extrusion lines. Learn more about TOPTICA's advanced terahertz solutions.

  • 1600 pulse traces / sec
  • Proprietary and patented ECOPS technology
  • Robust design, no mechanical delay line
  • Time-domain dynamic range: 50 dB in < 1 ms, 80 dB in 1 s
  • Spectral bandwidth: 3 THz in < 1 ms, 4 THz in 1 s

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Specifications TeraFlash smart
Scan speed 1600 traces/s (150 ps)
800 traces/s (300 ps)
200 traces/s (700 ps)
Spectral range 0.1 – 4.5 THz, in < 1 s
Spectral peak dynamic range typ. 35 dB in < 1 ms
> 60 dB in 1 sec


Below: Schematic of the TeraFlash smart. Red: optical signals, blue: analog signals, black: digital signals.