Nanobase invites you to their first webinar of 2021. In this webinar, one of Nanobase's reference customers, Prof Mun Seok Jeong, demonstrates a technical edge of Nanobase's Raman instrumentation with examples of a recent project of AFM-Raman integration for TERS analysis. Prof. Jeong's presentation will be followed by a detailed explanation of Nanobase's Raman instrument capabilities and a Q&A session.

Topic: Toward Extreme Technology for Raman Scattering

Speaker: Prof. Mun Seok Jeong, Department of Physics, Hanyang University, Seoul, South Korea. 

Description: Since the discovery of Raman scattering, it has been used in various fields and has contributed to the development of science. With the expansion of the application field, the equipment technology has also advanced. In this presentation, research on nanomaterials using Raman imaging equipment will be introduced. In addition, the development of Tip-Enhanced Raman Scattering (TERS) which is the extreme technology of Raman research equipment, and analysis of two-dimensional nanomaterials such as graphene and transition metal dichalcogenides using TERS will be presented.

Date: Monday May 24 2021

Time: 17:30 local time Adelaide. 18:00 local time Sydney.


Registration is required to participate in this webinar for free. After registering, you will receive a confirmation email containing information about joining the webinar. Submit your pre-webinar questions about our products and technical capabilities to  . We will answer your questions during the live webinar Q&A session. 

About the Speaker: Prof. Mun Seok Jeong, a full professor at Hanyang University, has an intensive research focus on semiconductor nanophotonics, which has led him to winning several notable research awards, including Semiconductor Research Awards from the Korean Physical Society. In partnership with Nanobase, Prof. Jeong advises on a good number of instrumentation customization projects that serve both academic and industrial customers.