The general ongoing trend towards miniaturization in industry and research places high demands on precision measurement systems, which are expected to detect the motion of measurement objects in a wide frequency range and sub-nanometer resolution.

Laser interferometric vibrometers are the first choice for all applications where accurate and non-contact measurement of object motion is required. Due to the non-contact mode of operation, they offer the possibilities of fast analysis of the objects at different positions without any mechanical influence from the sensor.

In this approx. 45 min webinar from SIOS you will gain insight into the theory and practice of vibrometry. Among other things, their expert Wolfram Meyer will introduce you to the possibilities of using laser interferometric measurement methods to analyze object vibrations, for example, to optimize product properties or to get to the bottom of vibration phenomena in the scientific field.

The following topics will be presented in our webinar:

  • technical concepts of homodyne laser interferometric vibrometry
  • setup of the vibration measuring station for vibrometers
  • optimization of the signal-to-noise ratio
  • application examples from industry and science
  • Presentation of vibration measurement software as well as variants of data output and measured value synchronization
  • suitable hardware and software interfaces

The speaker, Wolfram Meyer, will be pleased to answer your questions after the presentation.

REGISTER NOW for the webinar in English, available in two time slots, by clicking on the link below.

First Session Webinar

Nov. 30, 2021 // 8:30 am (Berlin time)

Australian Eastern time:

Tuesday, November 30, 2021
06:30 PM - 07:30 PM

Adelaide time:

Tuesday, November 30, 2021
06:00 PM - 07:00 PM

Second Session Webinar

Nov. 30, 2021 // 3:30 pm (Berlin time)

Australian Eastern time:

Wednesday, December 1, 2021
01:30 AM - 02:30 AM

Adelaide time

Wednesday, December 1, 2021
01:00 AM - 02:00 AM

Download flyer for the event here

 

 

 

Metrology