• Abberior Instruments and Super Resolution Microscopy at Lastek
    Abberior Instruments and Super Resolution Microscopy at Lastek

    Abberior Instruments has partnered with Lastek in Australia and New Zealand to offer the most complete experience for super resolution microscopy. Read more here.

  • Raptor Photonics OWL 640 SWIR camera
    Raptor Photonics OWL 640 SWIR camera

    Raptor Photonics OWL 640 is the best performing SWIR camera in the world. Demonstration system now available. Please enquire for details. Read more.

  • Toptica: DL pro with Digital Laser Controller DLC pro
    Toptica: DL pro with Digital Laser Controller DLC pro

    The new digital laser controller for TOPTICA’s tunable diode laser DL pro sets new benchmarks with regards to low noise and low drift levels.

    Demonstration system now available. Please enquire for details.

  • High Finesse Laser Spectrum Analyzer Spectrometer for Broadband Sources
    High Finesse Laser Spectrum Analyzer Spectrometer for Broadband Sources

    Analyses multi-line or broadband spectra of cw and pulsed lasers, gas discharge lamps, and more.  Lastek currently have a demonstration system available for evaluation. Read more...

  • Alio Industries: True Nano™ Precision Motion Systems
    Alio Industries: True Nano™ Precision Motion Systems

    ALIO Designs and Manufacturers Proprietary Robotic Devices and Tools that Enable Precise Nano-Scale Movements for Manufacturing and Research & Development


Ocean Optics release new Calibration Sources


Ocean Optics spectrometer wavelength calibration sources are now available in configurations that span the UV to the NIR, with more convenient battery options, remote on/off, and LED indicators for battery charge and lamp activation.

The newer wavelength calibration source series (-2 models) includes mercury-argon (253-1700 nm), krypton (427-893 nm), neon (540-754 nm), argon (696-1704 nm) and xenon (986-1984 nm) gas-discharge emission sources.

With more emission lines to utilize, maintaining optimum spectrometer performance – for example, correcting for spectrometer baseline drift and related phenomena inherent to all spectrometers — is simpler to achieve.

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Becker and Hickl: TCSPC System Records FLIM of a Rotating Object


Small-animal tomography techniques - no matter whether optical or non-optical - often use rotation of the measurement object to obtain data for different projection angles. Such techniques can favourably be supplemented by recording time-resolved data, especially fluorescence lifetime images or time-resolved diffuse reflection images. The fluorescence lifetime delivers direct information on molecular parameters, and time-resolved diffuse reflection data deliver scattering and absorption parameters from different tissue layers.

To facilitate such combination techniques we developed a FLIM system which records a lifetime image of the entire circumferential surface of a three-dimensional object. The object is rotated around its vertical axis and simultaneously scanned vertically by a fast galvanometer scanner. The excitation light comes from a BDS-SM family picosecond diode laser. FLIM is recorded by a standard SPC-150 TCSPC module via the normal multidimensional recording process of the bh TCSPC devices. The resulting image is a developed view of the entire sample surface, containing a full fluorescence decay curve in each pixel.

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Lyncée Tec Digital Holographic Camera

Flowing RBC Digital Holographic Camera 20x

Flowing RBC imaged at 20x using the Digital Holographic Camera

The Lyncée TecDigitalHolographic Camera is a cost-effective module that can readily be attached to the side port of your fluorescence microscope. It allows to easily obtain phase images from a standard fluorescence microscope with a simple module addition.

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Ekspla: New industrial picosecond laser Atlantic models feature higher average power and longer lifetime

Atlantic series High Power Picosecond Lasers 1

Ekspla has updated its industrial picosecond laser line. The updated Atlantic line features industrial laser models with higher average power and prolonged lifetime for UV versions. To ensure simple model navigation, all Atlantic series products have been rearranged into three groups according to output wavelength: Atlantic IR, Atlantic VIS and Atlantic UV series.

Dedicated for heavy-duty real industry applications, Atlantic UV models feature third harmonics – up to 355 nm output wavelength, and cover versions from 1W up to 30 W output power. Due to the redesign of harmonics module, stress on optical components is reduced, resulting in longer lifetime and lower short time thermal effects for perfect beam quality at various operation conditions. For easy and fast UV optics replacement, the Atlantic UV series model has a single wavelength output.

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LaVision New ParticleMaster inspex system for size, shape and velocity measurements of particles and droplets in laboratory use

ParticleMaster inspex 2

LaVision’s new ParticleMaster inspex system is a highly integrated testing tool for in-situ size, shape, and velocity measurements of spray droplets, particles and granules.

The high-magnification LaVisionParticleMaster inspex imaging system operates with a large variety of media and particle types. The compact self-contained probes and light sources in splash proof (IP54) design makes it ideal for application in harsh and challenging environment. The entire system runs "out-of-the-box". With the factory calibration included, it can be easily integrated into laboratory testing environment. Probes are available for different sizing ranges and working distances to match the individual needs.

The probes come with high resolution detectors for size and optional velocity measurements. The built-in laser-free light source guarantees eye-safe operation and ultra-short exposure to capture even fast moving droplets and particles. The whole system uses a dedicated controller for an easy use of the system. The ParticleMaster software package offers versatile analysis option like size histograms, scatterplots and weighted averages (D32, Dv50 etc.).

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