Fast and robust nanometric surface topography
The DHM R1000 is a reflection configuration microscope. It is suitable for totally and partially reflecting objects. Its ability to work with low reflective interfaces (down to 1% reflectivity), makes it the ideal tool for rapid inspection and accurate surface topography measurements on a large variety of samples.
As a result of its very high vertical resolution better than 1 nanometer, DHM R1000 is particularly suited for applications on smooth and polished surfaces with an averaged roughness of less than 0.2 µm. For higher averaged roughnesses, DHM performances depend on the specimen geometry, and on the desired measurements. Vertical scanning, available as an option, allows the vertical measurement range to be increased, but with a decreased vertical resolution.
Thanks to its high acquisition rate and ease of use, DHM R1000 allows rapid routine inspections, automated industrial quality control as well as R&D applications, particularly for dynamic observations. Stroboscopic synchronisation is available as an option and enables characterization of high frequency periodic motions.
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