ElectroChemistry

Princeton Applied Research VersaSCAN Electrochemical Scanning System

versascan

Shown above: VersaSCAN SECM Scanning ElectroChemical Microscopy

The VersaSCAN from Princeton Applied Research is a single platform capable of providing spatial resolution to both electrochemical and materials-based measurements.  Each VersaSCAN is based on a common high-resolution, long-travel, closed-loop positioning system mounted to a vibration-resistant optical base.  Different auxiliary pieces are mounted to the positioning system.  These ancillary pieces (e.g., an electrometer, piezo vibration unit, or a laser sensor) provide functionality to the positioning system for different scanning probe experiments.  VersaSTAT potentiostats and Signal Recovery Lock-in Amplifiers are integrated via ethernet control to make accurate measurements of these small signals.

  • Scanning Electrochemical Microscopy (SECM)
  • Scanning Vibrating Electrode Technique (SVET)
  • Scanning Kelvin Probe (SKP)
  • Localized Electrochemical Impedance Spectroscopy (LEIS)
  • Scanning Droplet System (SDS)
  • Non-Contact Surface Profiling (OSP)

 

Each technique uses a different measurement probe that is positioned close, but not in conact to the sample.  After a measurement is made at the probe, its position is incremented.  Plotting recorded parameter versus probe position creates a data map.  Depending on the technique, this map could represent local electrochemical current, impedance, relative work function, or topography.

VersaSCAN SECM: Scanning ElectroChemical Microscopy

The VersaSCAN SECM integrates the Base with two VersaSTAT Potentiostats and an ultramicroelectrode probe with a specific tapered polish.  SECM is a versatile technique adding spatial resolution to applications such as kinetics, biological sensors, catalyst, and corrosion mechanisms..

  • Compatible Potentiostats:  VersaSTAT 3F and either a VersaSTAT 3 / 3F /4
  • Capable of Approach Curves experiments and both Feedback Mode and Generator-Collector Mode imaging modes
  • Can perform Constant-Distance operation in conjunction with a topographic measurement technique, typically OSP
  • VersaSTATs are additionally capable of a vast suite of standard non-scanning electrochemical tests depending on their specific software model 

More information on other VersaSCAN systems:

  • Scanning Electrochemical Microscopy (SECM)
  • Scanning Vibrating Electrode Technique (SVET)
  • Scanning Kelvin Probe (SKP)
  • Localized Electrochemical Impedance Spectroscopy (LEIS)
  • Scanning Droplet System (SDS)
  • Non-Contact Surface Profiling (OSP)

VersaSCAN
Electrochemical Scanning System

The VersaSCAN is a single platform capable of providing spatial resolution to both electrochemical and materials-based measurements.  Each VersaSCAN is based on a common high-resolution, long-travel, closed-loop positioning system mounted to a vibration-resistant optical base.  Different auxiliary pieces are mounted to the positioning system.  These ancillary pieces (e.g., an electrometer, piezo vibration unit, or a laser sensor) provide functionality to the positioning system for different scanning probe experiments.  VersaSTAT potentiostats and Signal Recovery Lock-in Amplifiers are integrated via ethernet control to make accurate measurements of these small signals.

SECM

  • Scanning Electrochemical Microscopy (SECM)
  • Scanning Vibrating Electrode Technique (SVET)
  • Scanning Kelvin Probe (SKP)
  • Localized Electrochemical Impedance Spectroscopy (LEIS)
  • Scanning Droplet System (SDS)
  • Non-Contact Surface Profiling (OSP)

Each technique uses a different measurement probe that is positioned close, but not in conact to the sample.  After a measurement is made at the probe, its position is incremented.  Plotting recorded parameter versus probe position creates a data map.  Depending on the technique, this map could represent local electrochemical current, impedance, relative work function, or topography.

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