Solartron Analytical introduces the Apps-Lab XM Series

 Apps XM

Solartron Analytical’s new Apps-XM series of Xtreme Measurement products are each precisely focused on the requirements for specific applications.  These exciting new products have a much smaller footprint than most competitive units - delivering unmatched XM measurement performance while taking less of your restricted lab space.  Each XM module is individually calibrated using Solartron Analytical’s unique multi-point calibration and tested to rigorous standards ensuring best accuracy. Systems available:

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Solartron Analytical EnergyLab Electrochemical Impedance Analyzer

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Solartron Analytical's new EnergyLab XM is an application specific XM (Xtreme Measurement) Electrochemical Impedance Analyzer that is primarily focused on battery / fuel cell / supercapacitor research.

EnergyLab XM includes a reference grade potentiostat, frequency response analyzer (FRA) and 2A booster. The unit may be operated in boosted or unboosted mode (with automatic switching), providing optimum test conditions and accuracy for a wide range of energy devices.

EnergyLab XM’s extreme sensitivity allows complete characterization of prototype low current or low impedance new generation cells.

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Solartron Analytical EchemLab XM

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  • ±100 V polarization and compliance
  • High voltage auxiliary channels
  • Highest accuracy DC and EIS Multiple AC techniques include single sine, harmonic analysis (non-linear materials), multisine for faster low frequency tests

Solartron Analytical'sEchemLab XM is an application specific XM (Xtreme Measurement) product that is primarily focused on corrosion/coatings, and physical/analytical electrochemistry. EchemLab XM includes a reference grade potentiostat and frequency response analyzer (FRA). EchemLab XM has a built-in 100 V high voltage amplifier which can be used for not only for compliance measurements but also for high voltage cell polarization. This is useful in many high solution resistance applications, for example in organic electrochemistry. In addition to high voltage, power boosters can also be integrated to combine high current and high voltage in many specialized plating applications.

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Solartron Analytical SolarLab XM

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  1. ±100 V polarization and compliance
  2. High voltage auxiliary channels
  3. Highest accuracy DC and EIS
  4. Multiple AC techniques include single sine, harmonic analysis (non-linear materials), multisine for faster low frequency tests

Solartron Analytical'sSolarLab XM is an application specific XM (Xtreme Measurement) product that is primarily focused on solar cell / photovoltaic research, developed in conjunction with Professor Laurie Peter of the University of Bath, UK. SolarLab XM includes a reference grade potentiostat, frequency response analyzer (FRA) and PhotoEchem module that provide complete characterization of a wide range of Solar/PV cells, including Perovskite and Dye Sensitized Solar Cells (DSSC). Additionally, the system can be used for development of visible spectrum photo-electrochemical systems such as IronOxide photo-splitting of water. A key feature of this system is its ease of use, with data analysis requiring just one click of the mouse! For experienced users SolarLab XM offers the ability to develop new experiment types with the powerful step sequencer. 

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Solartron Analytical MaterialsLab XM

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  • Highest accuracy DC (IV, fast pulse) and EIS (C-V, impedance, Mott-Schottky)
  • Instant switching between DC and EIS - without changing sample connections
  • Low frequency to 10 µHz for degradation, trap state and material purity studies
  • Multiple AC techniques include single sine, harmonic analysis (non-linear materials), multisine for faster low frequency tests

Materials Lab XM is an application specific XM (Xtreme Measurement) product that is primarily focused on materials research. The Materials Lab XM product provides a fully integrated reference grade time domain and AC measurement platform. No need to switch sample connections between techniques. Time domain measurements include I-V (current voltage) characterization as well as fast pulse techniques. AC testing techniques include everything from single-sine analysis, to multisine / Fast Fourier Transform for faster low frequency analysis, to harmonics and intermodulation for testing linearity and breakdown of materials. Measurements of electrical impedance spectroscopy (EIS), admittance, permittivity and capacitance are all provided from the XMstudio MTS software platform, together with integrated equivalent circuit analysis functionality. Time domain and AC tests can be combined in test sequences and instantly switched, allowing DC and pulse waveforms to activate charge carriers, followed immediately by EIS analysis of the activated carriers. This closely linked integration is only with the Materials Lab XM.

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Solartron Analytical: ModuLab XM PhotoEchem System

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The Solarton Analytical ModuLab® XM PhotoEchem system is a fully integrated photoelectrochemical measurement system with comprehensive techniques including IPCE, IMPS, IMVS, EIS, Photovoltage Decay, and Charge Extraction.  

"The system, based upon Solartron Analytical's world-leading experience in transfer function measurements, offers a high-quality measurement platform for characterizing a range of photoelectrochemical devices such as DSSC's, Perovskite cells, and Photoanodes," noted Professor Laurie Peter, world leading expert, University of Bath, UK. Professor Peter acted as scientific advisor during the development of the ModuLab PhotoEchem system and helped ensure the system met the requirements of the most demanding photovoltaic researchers in the market today. 

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Princeton Applied Research PARSTAT 3000 Potentiostat | Galvanostat

The Princeton Applied Research PARSTAT® 3000 is a high-performance potentiostat engineered into a small foot-print for space conscious laboratory and/or application environments. The additional voltage measurement (6-WIRE) makes this instrument well suited for Electrochemical Impedance Spectroscopy (EIS) on batteries as two impedance values can be simultaneously acquired. Users can assign impedance values to anode and cathode; across separators; or to individual cells in a stack.  Physical electrochemistry applications also benefit from using this input to capture pH measurements, temperature, or pressure by means of an external probe.

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Princeton Applied Research VersaSCAN Electrochemical Scanning System

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Shown above: VersaSCAN SECM Scanning ElectroChemical Microscopy

The VersaSCAN from Princeton Applied Research is a single platform capable of providing spatial resolution to both electrochemical and materials-based measurements.  Each VersaSCAN is based on a common high-resolution, long-travel, closed-loop positioning system mounted to a vibration-resistant optical base.  Different auxiliary pieces are mounted to the positioning system.  These ancillary pieces (e.g., an electrometer, piezo vibration unit, or a laser sensor) provide functionality to the positioning system for different scanning probe experiments.  VersaSTAT potentiostats and Signal Recovery Lock-in Amplifiers are integrated via ethernet control to make accurate measurements of these small signals.

  • Scanning Electrochemical Microscopy (SECM)
  • Scanning Vibrating Electrode Technique (SVET)
  • Scanning Kelvin Probe (SKP)
  • Localized Electrochemical Impedance Spectroscopy (LEIS)
  • Scanning Droplet System (SDS)
  • Non-Contact Surface Profiling (OSP)

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