Nanonics Imaging: Combined SEM/FIB/AFM


Electron microscopes are a driving force in the nanotechnological revolution. Atomic force microscopy along with scanning tunneling microscopy is another enabling technology in the growing field of nanotechnology. These two worlds, although highly complementary, have generally been separate and apart. For the first time ever, Nanonics Imaging Ltd, in its drive for integrated microscopic solutions has now been able to fully and transparently integrate these two worlds.

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